Cheng, Chi-Lun, <br/><br/>
Statistical regression with measurement error / 
Chi-Lun Cheng and John W. Van Ness. 
 - 262 páginas. 
<br/><br/><label>ISBN: </label>0340614617 
<br/><br/><label>Subjects--Topical Terms: </label><br/>ANALISIS DE REGRESION<br/>ANALISIS DE ERROR (MATEMATICA)<br/>ESTADISTICA
<br/><br/><label>Dewey Class. No.: </label>519.536